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CVE-2024-45573
Published: Feb 3, 2025
Modified: Feb 12, 2025
PUBLISHED
CVSS v3.1
7.8
HIGH
Description
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
| Vendor | Product | Versions |
|---|---|---|
Qualcomm, Inc. | Snapdragon | affected FastConnect 6700affected FastConnect 6900affected FastConnect 7800affected QCM5430affected QCM6490+19 more versions |
Weaknesses (CWE)
CVSS v3.1 Details
CVSS v3.1 Vector
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
Attack Vector
Local
Attack Complexity
Low
Privileges Required
Low
User Interaction
None
Scope
Unchanged
Confidentiality
High
Integrity
High
Availability
High
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