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CVE-2024-53017

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CVE-2024-53017

Published: Jun 3, 2025

Modified: Jun 3, 2025

PUBLISHED

CVSS v3.1

6.6

MEDIUM

Description

Memory corruption while handling test pattern generator IOCTL command.

VendorProductVersions

Qualcomm, Inc.

Snapdragon

affected
SDM429W
affected
Snapdragon 429 Mobile Platform
affected
WCN3620
affected
WCN3660B

Weaknesses (CWE)

CWE-823

CVSS v3.1 Details

CVSS v3.1 Vector

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L

Attack Vector

Local

Attack Complexity

Low

Privileges Required

Low

User Interaction

None

Scope

Unchanged

Confidentiality

Low

Integrity

High

Availability

Low

References

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