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CWE-1246

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CWE-1246

Improper Write Handling in Limited-write Non-Volatile Memories

Base
Incomplete

Description

The product does not implement or incorrectly implements wear leveling operations in limited-write non-volatile memories.

{"xhtml:p":["Non-volatile memories such as NAND Flash, EEPROM, etc. have individually erasable segments, each of which can be put through a limited number of program/erase or write cycles. For example, the device can only endure a limited number of writes, after which the device becomes unreliable. In order to wear out the cells in a uniform manner, non-volatile memory and storage products based on the above-mentioned technologies implement a technique called wear leveling. Once a set threshold is reached, wear leveling maps writes of a logical block to a different physical block. This prevents a single physical block from prematurely failing due to a high concentration of writes."]}

Common Consequences

Scope

Availability

Impact

DoS: Instability

Potential Mitigations

Architecture and Design
Implementation
Testing

Include secure wear leveling algorithms and ensure they may not be bypassed.

Applicable Platforms

Not Language-Specific

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